www.filmetrics.com/
Manufactures thin film thickness and optical constants measurement systems using non-contact optical technology for the semiconductor, optical, and coating ...
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en.wikipedia.org/wiki/Thin-film_thickness_monitor
Thin- film thickness monitors, deposition rate controllers, and so on, are a family of instruments used in high and ultra-high vacuum systems. They can measure ...
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www.azonano.com/nanotechnology-equipment.aspx?cat=73
Being able to measure the thickness and uniformity of these thin films is important as variations can effect the properties and performance of the final device.
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www.stellarnet-inc.com/PopularConfigurations_TFC.htm
StellarNet systems can measure thickness of non-metallic semiconductor process films. Also, StellarNet Thin Film Measurement systems can be used to locate ...
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www.nanovea.com/Application Notes/thinfilmthicknessmeasurement.pdf
From the description above, it can safely be said that thin film thickness control is ... measurement with no disturbance from transparent and or reflective surfaces.
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www.missionpeakoptics.com/
Manufacture of non-destructive thin film measurement systems.
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www.sensofar.com/products/products_thin_film.html
Sensofar???s thin film optical measurement systems and non contact thickness measurement: NanoCalc-2000 is the ideal tool for fast, reliable and easy ...
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www.sensoryanalytics.com/
Manufacturer of optical, RF and related sensors and systems to measure color and thickness for control applications. |
www.novacam.com/applications/thickness/
Low-coherence profilometers deliver fast and reliable non-contact thickness measurements of single-layer and multi-layer films with precision better than 1 ¦Ìm.
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www-kyg.stanford.edu/khuriyakub/opencms/Downloads/94_Pei_01.pdf
In-situ thin film thickness measurement is an important problem in semiconductor processing, which is currently limited by the lack of adequate sensors. Most ... |
